We analyze the uncertainty contribution of the Nonlinear-Embedding design technique in transposing the low-frequency data to microwave frequencies. Uncertainty analysis is performed with the NIST Microwave Uncertainty Framework and is applied to a GaAs pHEMT device.
Bosi, G., Raffo, A., Avolio, G., Schreurs, D., Humphreys, D. (2016). Impact of microwave measurement uncertainty on the Nonlinear Embedding procedure. In 87th ARFTG Microwave Measurement Conference: Measurements for Emerging Communications Technologies, ARFTG 2016 (pp.1-4). Institute of Electrical and Electronics Engineers Inc. [10.1109/ARFTG.2016.7501953].
Impact of microwave measurement uncertainty on the Nonlinear Embedding procedure
Bosi, Gianni;
2016
Abstract
We analyze the uncertainty contribution of the Nonlinear-Embedding design technique in transposing the low-frequency data to microwave frequencies. Uncertainty analysis is performed with the NIST Microwave Uncertainty Framework and is applied to a GaAs pHEMT device.
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