We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.
Bussoli, M., Batani, D., Desai, T., Canova, F., Milani, M., Trtica, M., et al. (2007). Study of laser induced ablation with focused ion beam/scanning electron microscope devices. LASER AND PARTICLE BEAMS, 25(1), 121-125 [10.1017/S0263034607070139].
Study of laser induced ablation with focused ion beam/scanning electron microscope devices
BATANI, DINO DIMITRI;MILANI, MARZIALE;
2007
Abstract
We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analysis of ablation results. Ablated samples have been obtained by irradiating an Al planar target with an optically smoothed iodine laser working at 0.44 mu m. The interpretation of FIB images shows the high potentiality of the technique.File in questo prodotto:
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